Quantitative Infrared Database Developed to Support Remote Sensing Applications

 

P.M. Chu, F.R. Guenther, G.C. Rhoderick, and P.A. Johnson

 

Objective: To develop the NIST Standard Reference Database 79 (SRD 79) “Quantitative Infrared Database” to support optical-based measurements of chemical emissions and hazardous air pollutants (HAP).

 

Problem: Over the last decade, growing concerns about the environment in general and air quality in particular have stimulated the development of improved, cost-effective field monitoring methods. With the recent advances in optical-based technologies, methods such as open-path Fourier transform infrared (FT-IR) spectroscopy are now becoming viable tools for field measurements. The in-situ and real-time nature of this approach offers several advantages over traditional point source monitoring techniques for applications such as determining fugitive emissions and chemical contaminants from industrial processing plants, hazardous waste and municipal landfills, water treatment plants, oil refineries, and chemical plants. Following successful testing of FT infrared methods during remediation of several Superfund sites, the US Environmental Protection Agency (EPA) has issued a protocol (TO-16) for FT infrared open-path remote sensing. Since molar absorptivity data in the literature widely differ, a validated quantitative database traceable to national measurement standards is a critical part of the infrastructure required for establishing emerging infrared-based monitoring technologies.  New infrared-based technologies coupled with the NIST spectral database provides both industry and EPA with a tool for assessing regulatory compliance that is both cost-effective and less invasive.

 

Approach: SRD 79 data are based on NIST primary gravimetric standards prepared with starting materials of assessed purity and procedures that minimize contamination. For each compound, the absorption coefficient spectrum was calculated using nine transmittance spectra and the Beer’s law relationship. The uncertainties in the absorption coefficient data are estimated from the data analysis and considerations of other error sources such as the non-linear detector response.  

 

The primary effort of this project has focused on acquiring data at 25 ºC.  To address the data needs of communities measuring industrial stack emissions by passive FT-IR and other infrared-based technologies, we have measured absorption coefficients for industrially important target gases, sulfur dioxide and methanol, at temperatures ranging from 25 ºC to 200 ºC.  This project included studies to quantify sample emission contributions to the measured single-beam spectra.

 

Results and Future Plans: Currently, absorption coefficient data for 40 HAPs on a US EPA priority list is available as the NIST Standard Reference Database (SRD) 79, Version 1.1 with Data Release 3.0. The data are stored in the standard JCAMP-DX format to enable universal access to the data. The 0.12 cm–1 resolution data were processed to generate data at a number of different resolutions and apodizations to provide users with data that closely match their experimental parameters.  A digital signature accompanies each data file, allowing users to ensure the integrity and source of the data file and traceability to NIST.

 

Data comparisons with Battelle Pacific Northwest laboratories and the higher temperature data project have helped us characterize two additional FT-IR intensity artifacts. Both of these artifacts are associated with the single limiting aperture design in most commercial FT-IRs. The first artifact is attributed to the detector viewing the warm annulus of the aperture in higher resolution measurements (0.2 cm‑1 or higher). The off-axis rays distort the line shapes and increase the observed band intensities. The second artifact is due to the light exiting the interferometer, which is directed towards the source, can be reflected off the aperture back into the interferometer. This double modulated light produces a 2f alias throughout the spectrum. Reducing the reflectivity of the aperture wheel minimizes this artifact. 

Adding an additional aperture system or a multipass cell after the interferometer minimizes the off-axis rays that reach the detector and in turn the contributions from these artifacts.  For SRD 79, all of the data was acquired with a multipass cell and the potential biases due to these artifacts are within the stated uncertainties in the finger print region and no biases are expected at higher frequencies. The higher temperature absorption coefficient data required additional measurements with the infrared source off to appropriately account for sample emission issues.  At 200 ºC, the sample emission correction is approximately 10 % for bands in the spectral region near 1000 cm-1 for the instrument and optical configuration used.

 

This quantitative infrared database is an ongoing project at NIST.  Additional spectra will be added to the database as they are acquired and updates will be available over the internet. Plans include continued data acquisition for the compounds listed in the 1990 US EPA Clean Air Act Amendment, as well as for those compounds that are of concern in global warming and emissions trading. Additionally, comparisons of NIST primary standards and molar absorptivity data with National Metrology Institutes and other laboratories will be expanded to facilitate the use of this database in issues of global interest and impact.

 

Recent Publications:   

Intensity Artifacts in Gas Phase FTIR Spectroscopy: Focus on the Aperture”, S.W. Sharpe, R.L. Sams, T.J. Johnson, and P.M. Chu, Fourier Transform Spectroscopy, Trends in Optics and Photonics Series, Vol 51, Optical Society of America, 2001.

 

Infrared Absorptivity Temperature Dependence of Gas Phase Methanol and Sulfur Dioxide”, P.M. Chu, G.C. Rhoderick, P.A. Johnson, NISTIR 6773, National Institute of Standards and Technology, Gaithersburg, MD 20899, August 2001.

 

Removing Aperture-Induced Artifacts from FTIR Intensity Values”, T.J. Johnson, R.L. Sams, T.A. Blake, S.W. Sharpe, and P.M. Chu, submitted to Applied Optics. 

 

Data Release 3.0 for NIST Standard Reference Database 79 CD, P.M. Chu, F.R. Guenther, G.C. Rhoderick, National Institute of Standards and Technology, Gaithersburg, MD 20899-8393, August 2001.