JCTLM

List of Higher Order Request for Nominations of Certified Reference Materials and Reference Measurement Procedures for Listing as “Higher-Order”; JCTLM Cycle III Solicitation Request for Nominations of Reference Measurement Laboratory Services; JCTLM Cycle 1 Solicitation Analyte Categories and Review Team Chairs JCTLM database: Laboratory Medicine and in vitro Diagnostics: Database of Higher Order Reference Materials and Reference Measurement Procedures JCTLM Commentary Article as published in IVD Technology, March 2006 Quality Manuals JCTLM WG-1 Quality Manual JCTLM WG-2 Procedure Manual What is the JCTLM ? IFCC EQAS for Reference Laboratories JCTLM Related Presentations NCCLS 2004 Leadership ConferenceDelegate Workshop on Metrological Traceability, March 20, 2004 ACCC Conference - - Manufacturer's Update on the Activities of the Joint Committee for Traceability in Laboratory Medicine, July 22, 2003

If there are questions about JCTLM WG-1 activities in general or any particular issues concerning the Reference Method and/or Reference Materials review process, please contact:
	Co - Chair	Co-Chair
	Dr. Willie E May National Institute of Standards and Technology (NIST) Chemical Science and Technology Laboratory ACSL (227), Room A311, MS 8300 Gaithersburg, Maryland 20899-8300 UNITED STATES Tel: +1 301 975 8300 Fax: +1 301 975-3845 E-mail: wem@nist.gov	Dr. Heinz Schimmel Institute for Reference Materials and Measurements (IRMM) European Commission - Directorate General JRC Retieseweg B-2440 Geel BELGIUM Tel: +32 14 571 720 Fax: +32 14 590 406 E-mail: Heinz.SCHIMMEL@cec.eu.int
	JCTLM Secretariat	Chair, Quality Systems Team
	Dr. Robert Wielgosz Head of Chemistry Section Bureau International des Poids et Mesures Pavillon De Breteuil F-92312 Sevres Cedex FRANCE Tel: +33 1 45 07 6251 Fax: +33 1 45 34 2021 E-mail: jctlm@bipm.org	Dr. Craig Jackson 5931 Seacrest View Road San Diego, California 92121-4352 UNITED STATES Tel: +1 619 638 0956 E-mail : cjackso2@san.rr.com

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Date created: March 26, 2004
Last updated: June 21, 2006
Contact: wem@nist.gov