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Measurement Expertise

Electron Beam Microanlaysis Methods (SEM, EPMA, AEM, Auger, ESEM, WDS, EDS, EELS)Microbeam Mass Spec (SIMS, TOF-SIMS, LMMS, Cluster SIMS)Optical Microscopies and Spectroscopies (NSOM, MicroRaman, MicroIR, Nonlinerar Optics)Particles and Powders (Standards, PM2.5, Size, Composition, Image AnalysisThin Films and Coatings (Semiconductor, Thermal Barrier, Optical, etc.)Scanned Probe Techniques (AFM, Near-field Raman,IR,Microwave)X-Ray Beam Methods (XPS, MicroXRD, MicroXRF) Isotopic Methods (SIMS, TOF-SIMS, AMS, IRMS)

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Chemical Characterization of MaterialsEnvironmental MeasurementsInternational StandardsMicroelectronicsNanotechnology

 

newHighlights

TECHBEAT: Frozen Lightning: NIST's New Nanoelectronic Switch

 NIST Chemist James Kushmerick adjusts test apparatus demonstrating a prototype silver nanoswitch

Future Meetings

Past Meetings

MAS-NIST Topical Workshop
Hyperspectral Imaging II
October 23-26, 2007

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Technical Contact
richard.cavanagh@nist.gov

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Last updated: January 22, 2008