Microanalysis & Analytical Microscopy Research Group Major Instrumentation Resources:

• JEOL 8600 Electron Microprobe with wavelength-dispersive x-rayspectrometry (WDS) and energy-dispersive x-ray spectrometry (EDS),automated
  
  
• JEOL 840 Analytical Scanning Electron Microscope, with WDS and EDS, automated
  
  
• Hitachi S4500 Field Emission Scanning Electron Microscope
  
  
• Electroscan 2020 Environmental Scanning Electron Microscope
  
  
• Philips CM30 Analytical Electron Microscope (EDS and parallel EELS)
  
  
• Philips CM300 Field Emission 300 kV Scanning Transmission Electron Microscope
  
  
• Vacuum Generators HB-501 Field Emission Scanning Transmission Electron Microscope (EDS and parallel EELS, located at the NIST/NIH Nanomete Analysis Facility)
  
  
• Electron/X-ray Optical Bench for fundamental studies
  
  
• Cameca IMS-3F Ion Microscope
  
  
• Cameca IMS-4F Ion Microscope/Ion Microprobe
  
  
• Kratos/Cambridge Mass Spectrometry PRISM Time-of-Flight SIMS/LAMMS
  
  
• Leybold-Heraeus LAMMA-500 Laser Microprobe Mass Analyzer
  
  
• Laser Raman microprobe (NIST-developed) with parallel detection and multichannel spectrometer
  
  
• Brucker Micro-Raman/Fourier-transform Infrared Microscope
  
  
• Philips Automated Powder X-ray Diffractometers (three units)
  
  
• Rigaku Rotating Anode X-ray Source (18 kW) with Position Sensitive Microdiffractometer and Powder Diffractometer
  
  
• X-ray Optical Bench for fundamental focussing studies
  
  
• Park Scientific Atomic Force Microscope
  
  
• Leitz, Wild and Olympus Optical Microscopes, automated fluorescence spectrometer
  
  
• Video Radiation Detector/Perceptics imaging station
  
  
• Ion Beam Milling and Ion Beam Sputter-Deposition Systems
  DEC VAX 3900; micro-VAX workstations, IBM PC and Apple Macintosh computers