Linear and nonlinear laser-based spectroscopies for mono/multilayer films
The Surface and Microanalysis Science Division of CSTL performs research into new and improved measurements, standards, and instrumentation for spectroscopic characterization of thin films and interfaces. Specific emphasis is placed on optical spectroscopies, such as ellipsometry, IR absorption, and nonlinear vibrational spectroscopies, and electron spectroscopies such as XPS, UPS, and two-photon photoemission.
